High-Speed Probe Card Analysis: Using Real-time Machine Vision and Image Restoration Technique

 
9783659488351: High-Speed Probe Card Analysis: Using Real-time Machine Vision and Image Restoration Technique
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Probe cards represent an indispensable component in wafer testing processes. Due to their frequent contacts with wafer pads, the physical condition of probe cards needs to be closely monitored and analyzed to maintain the integrity of testing. This paper proposes a new vision-based probe card analysis technique that can be applied to a situation where the vision system is continuously running to take moving images for fast inspection. The approach taken in this paper is to operate the machine vision in time synchrony with the position sensing and to restore the blurred pixel data with the image restoration technique. The main concepts are demonstrated using an experimental test bed and a commercial probe card. Compared to the existing stop-and-go approach, the proposed technique can substantially enhance the inspection speed without additional cost for major hardware change.

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A mechanical engineer who expertises in building equipments, automation, wind turbines and machine vision systems.

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Shin, Bonghun
ISBN 10: 3659488356 ISBN 13: 9783659488351
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Descripción Condición: New. Publisher/Verlag: LAP Lambert Academic Publishing | Using Real-time Machine Vision and Image Restoration Technique | Probe cards represent an indispensable component in wafer testing processes. Due to their frequent contacts with wafer pads, the physical condition of probe cards needs to be closely monitored and analyzed to maintain the integrity of testing. This paper proposes a new vision-based probe card analysis technique that can be applied to a situation where the vision system is continuously running to take moving images for fast inspection. The approach taken in this paper is to operate the machine vision in time synchrony with the position sensing and to restore the blurred pixel data with the image restoration technique. The main concepts are demonstrated using an experimental test bed and a commercial probe card. Compared to the existing stop-and-go approach, the proposed technique can substantially enhance the inspection speed without additional cost for major hardware change. | Format: Paperback | Language/Sprache: english | 68 pp. Nº de ref. del artículo: K9783659488351

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Bonghun Shin
Publicado por LAP Lambert Academic Publishing Nov 2013 (2013)
ISBN 10: 3659488356 ISBN 13: 9783659488351
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Descripción LAP Lambert Academic Publishing Nov 2013, 2013. Taschenbuch. Condición: Neu. Neuware - Probe cards represent an indispensable component in wafer testing processes. Due to their frequent contacts with wafer pads, the physical condition of probe cards needs to be closely monitored and analyzed to maintain the integrity of testing. This paper proposes a new vision-based probe card analysis technique that can be applied to a situation where the vision system is continuously running to take moving images for fast inspection. The approach taken in this paper is to operate the machine vision in time synchrony with the position sensing and to restore the blurred pixel data with the image restoration technique. The main concepts are demonstrated using an experimental test bed and a commercial probe card. Compared to the existing stop-and-go approach, the proposed technique can substantially enhance the inspection speed without additional cost for major hardware change. 68 pp. Englisch. Nº de ref. del artículo: 9783659488351

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Bonghun Shin
Publicado por LAP Lambert Academic Publishing Nov 2013 (2013)
ISBN 10: 3659488356 ISBN 13: 9783659488351
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BuchWeltWeit Inh. Ludwig Meier e.K.
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Descripción LAP Lambert Academic Publishing Nov 2013, 2013. Taschenbuch. Condición: Neu. Neuware - Probe cards represent an indispensable component in wafer testing processes. Due to their frequent contacts with wafer pads, the physical condition of probe cards needs to be closely monitored and analyzed to maintain the integrity of testing. This paper proposes a new vision-based probe card analysis technique that can be applied to a situation where the vision system is continuously running to take moving images for fast inspection. The approach taken in this paper is to operate the machine vision in time synchrony with the position sensing and to restore the blurred pixel data with the image restoration technique. The main concepts are demonstrated using an experimental test bed and a commercial probe card. Compared to the existing stop-and-go approach, the proposed technique can substantially enhance the inspection speed without additional cost for major hardware change. 68 pp. Englisch. Nº de ref. del artículo: 9783659488351

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Bonghun Shin
Publicado por LAP Lambert Academic Publishing (2013)
ISBN 10: 3659488356 ISBN 13: 9783659488351
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Descripción LAP Lambert Academic Publishing, 2013. Paperback. Condición: New. Language: English . Brand New Book. Probe cards represent an indispensable component in wafer testing processes. Due to their frequent contacts with wafer pads, the physical condition of probe cards needs to be closely monitored and analyzed to maintain the integrity of testing. This paper proposes a new vision-based probe card analysis technique that can be applied to a situation where the vision system is continuously running to take moving images for fast inspection. The approach taken in this paper is to operate the machine vision in time synchrony with the position sensing and to restore the blurred pixel data with the image restoration technique. The main concepts are demonstrated using an experimental test bed and a commercial probe card. Compared to the existing stop-and-go approach, the proposed technique can substantially enhance the inspection speed without additional cost for major hardware change. Nº de ref. del artículo: KNV9783659488351

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