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Descripción Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Probe cards represent an indispensable component in wafer testing processes. Due to their frequent contacts with wafer pads, the physical condition of probe cards needs to be closely monitored and analyzed to maintain the integrity of testing. This paper proposes a new vision-based probe card analysis technique that can be applied to a situation where the vision system is continuously running to take moving images for fast inspection. The approach taken in this paper is to operate the machine vision in time synchrony with the position sensing and to restore the blurred pixel data with the image restoration technique. The main concepts are demonstrated using an experimental test bed and a commercial probe card. Compared to the existing stop-and-go approach, the proposed technique can substantially enhance the inspection speed without additional cost for major hardware change. 68 pp. Englisch. Nº de ref. del artículo: 9783659488351
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Descripción Taschenbuch. Condición: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Probe cards represent an indispensable component in wafer testing processes. Due to their frequent contacts with wafer pads, the physical condition of probe cards needs to be closely monitored and analyzed to maintain the integrity of testing. This paper proposes a new vision-based probe card analysis technique that can be applied to a situation where the vision system is continuously running to take moving images for fast inspection. The approach taken in this paper is to operate the machine vision in time synchrony with the position sensing and to restore the blurred pixel data with the image restoration technique. The main concepts are demonstrated using an experimental test bed and a commercial probe card. Compared to the existing stop-and-go approach, the proposed technique can substantially enhance the inspection speed without additional cost for major hardware change. Nº de ref. del artículo: 9783659488351
Descripción PAP. Condición: New. New Book. Delivered from our UK warehouse in 4 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000. Nº de ref. del artículo: L0-9783659488351
Descripción Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Shin BonghunA mechanical engineer who expertises in building equipments, automation, wind turbines and machine vision systems.Probe cards represent an indispensable component in wafer testing processes. Due to their frequent cont. Nº de ref. del artículo: 5159353