Thin Film Analysis by X-Ray Scattering

4,5 valoración promedio
( 2 valoraciones por Goodreads )
 
9783527310524: Thin Film Analysis by X-Ray Scattering

With contributions by Paul F. Fewster and Christoph Genzel

While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications.
Grain size, porosity, density, preferred orientation and other properties are important to know: whether thin films fulfill their intended function depends crucially on their structure and morphology once a chemical composition has been chosen. Although their backgrounds differ greatly, all the involved specialists a profound understanding of how structural properties may be determined in order to perform their respective tasks in search of new and modern materials, coatings and functions. The author undertakes this in-depth introduction to the field of thin film X-ray characterization in a clear and precise manner.

"Sinopsis" puede pertenecer a otra edición de este libro.

From the Back Cover:

While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications.
Grain size, porosity, density, preferred orientation and other properties are important to know: whether thin films fulfill their intended function depends crucially on their structure and morphology once a chemical composition has been chosen. Although their backgrounds differ greatly, all the involved specialists a profound understanding of how structural properties may be determined in order to perform their respective tasks in search of new and modern materials, coatings and functions. The author undertakes this in-depth introduction to the field of thin film X-ray characterization in a clear and precise manner.

About the Author:

Dr. Mario Birkholz was born 1958 in Hamburg, Germany. He studied physics at the Free University of Berlin and completed his diploma thesis on structural investigations of biological membranes in 1986, and obtained his Ph.D. on the structure of stoichiometry deviations in iron-pyrite in 1990. Research positions at Hahn-Meitner-Institut Berlin, at Fraunhofer Institute for Thin Film and Surface Technology, Braunschweig, and at IHP Microelectronics, Frankfurt (Oder), followed.
He is involved in the development of thin film systems for applications in photovoltaics, sensor technology and as protective coatings. His main scientific interest is focused on the structure and morphology of thin films, their investigation by x-ray scattering techniques and the relation between structure and function.

"Sobre este título" puede pertenecer a otra edición de este libro.

Comprar nuevo Ver libro

Gastos de envío: EUR 6,72
De Reino Unido a Estados Unidos de America

Destinos, gastos y plazos de envío

Añadir al carrito

Los mejores resultados en AbeBooks

1.

Mario Birkholz
Editorial: Wiley 2005-11-15, Weinheim :|[Chichester (2005)
ISBN 10: 3527310525 ISBN 13: 9783527310524
Nuevos Tapa dura Cantidad: 1
Librería
Blackwell's
(Oxford, OX, Reino Unido)
Valoración
[?]

Descripción Wiley 2005-11-15, Weinheim :|[Chichester, 2005. hardback. Estado de conservación: New. Nº de ref. de la librería 9783527310524

Más información sobre esta librería | Hacer una pregunta a la librería

Comprar nuevo
EUR 125,36
Convertir moneda

Añadir al carrito

Gastos de envío: EUR 6,72
De Reino Unido a Estados Unidos de America
Destinos, gastos y plazos de envío

2.

Mario Birkholz
Editorial: Wiley VCH 2005-11-15 (2005)
ISBN 10: 3527310525 ISBN 13: 9783527310524
Nuevos Cantidad: 2
Librería
Chiron Media
(Wallingford, Reino Unido)
Valoración
[?]

Descripción Wiley VCH 2005-11-15, 2005. Estado de conservación: New. Brand new book, sourced directly from publisher. Dispatch time is 24-48 hours from our warehouse. Book will be sent in robust, secure packaging to ensure it reaches you securely. Nº de ref. de la librería NU-LBR-01548049

Más información sobre esta librería | Hacer una pregunta a la librería

Comprar nuevo
EUR 142,14
Convertir moneda

Añadir al carrito

Gastos de envío: EUR 3,35
De Reino Unido a Estados Unidos de America
Destinos, gastos y plazos de envío

3.

Mario Birkholz
Editorial: Wiley VCH
ISBN 10: 3527310525 ISBN 13: 9783527310524
Nuevos Tapa dura Cantidad: 4
Librería
THE SAINT BOOKSTORE
(Southport, Reino Unido)
Valoración
[?]

Descripción Wiley VCH. Hardcover. Estado de conservación: New. New copy - Usually dispatched within 2 working days. Nº de ref. de la librería B9783527310524

Más información sobre esta librería | Hacer una pregunta a la librería

Comprar nuevo
EUR 146,72
Convertir moneda

Añadir al carrito

Gastos de envío: EUR 7,78
De Reino Unido a Estados Unidos de America
Destinos, gastos y plazos de envío

4.

Mario Birkholz
Editorial: Wiley VCH (2005)
ISBN 10: 3527310525 ISBN 13: 9783527310524
Nuevos Cantidad: 3
Librería
Books2Anywhere
(Fairford, GLOS, Reino Unido)
Valoración
[?]

Descripción Wiley VCH, 2005. HRD. Estado de conservación: New. New Book. Shipped from UK in 4 to 14 days. Established seller since 2000. Nº de ref. de la librería FW-9783527310524

Más información sobre esta librería | Hacer una pregunta a la librería

Comprar nuevo
EUR 145,29
Convertir moneda

Añadir al carrito

Gastos de envío: EUR 10,09
De Reino Unido a Estados Unidos de America
Destinos, gastos y plazos de envío

5.

Mario Birkholz
Editorial: Wiley-VCH (2005)
ISBN 10: 3527310525 ISBN 13: 9783527310524
Nuevos Tapa dura Cantidad: 1
Librería
Irish Booksellers
(Rumford, ME, Estados Unidos de America)
Valoración
[?]

Descripción Wiley-VCH, 2005. Hardcover. Estado de conservación: New. book. Nº de ref. de la librería M3527310525

Más información sobre esta librería | Hacer una pregunta a la librería

Comprar nuevo
EUR 164,76
Convertir moneda

Añadir al carrito

Gastos de envío: GRATIS
A Estados Unidos de America
Destinos, gastos y plazos de envío

6.

Birkholz, Mario
Editorial: Wiley-VCH (2005)
ISBN 10: 3527310525 ISBN 13: 9783527310524
Nuevos Tapa dura Cantidad: 2
Librería
Murray Media
(North Miami Beach, FL, Estados Unidos de America)
Valoración
[?]

Descripción Wiley-VCH, 2005. Hardcover. Estado de conservación: New. Never used!. Nº de ref. de la librería P113527310525

Más información sobre esta librería | Hacer una pregunta a la librería

Comprar nuevo
EUR 166,00
Convertir moneda

Añadir al carrito

Gastos de envío: EUR 1,69
A Estados Unidos de America
Destinos, gastos y plazos de envío

7.

Mario Birkholz
Editorial: Wiley-VCH Verlag GmbH (2005)
ISBN 10: 3527310525 ISBN 13: 9783527310524
Nuevos Tapa dura Primera edición Cantidad: 1
Librería
Valoración
[?]

Descripción Wiley-VCH Verlag GmbH, 2005. Estado de conservación: New. Nº de ref. de la librería L9783527310524

Más información sobre esta librería | Hacer una pregunta a la librería

Comprar nuevo
EUR 173,57
Convertir moneda

Añadir al carrito

Gastos de envío: EUR 2,99
De Alemania a Estados Unidos de America
Destinos, gastos y plazos de envío

8.

Mario Birkholz
Editorial: Wiley VCH Verlag Gmbh Okt 2005 (2005)
ISBN 10: 3527310525 ISBN 13: 9783527310524
Nuevos Cantidad: 1
Librería
Rheinberg-Buch
(Bergisch Gladbach, Alemania)
Valoración
[?]

Descripción Wiley VCH Verlag Gmbh Okt 2005, 2005. Buch. Estado de conservación: Neu. Neuware - Whereas the X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications. Grain size, porosity, density, preferred orientation and other properties are important to know: whether thin films fulfill their intended function depends crucially on their structure and morphology once a chemical composition has been chosen. Although their backgrounds differ greatly, all the involved specialists a profound understanding of how structural properties may be determined in order to perform their respective tasks in search of new and modern materials, coatings and functions. The author undertakes this in-depth introduction to the field of thin film X-ray characterization in a clear and precise manner. 400 pp. Englisch. Nº de ref. de la librería 9783527310524

Más información sobre esta librería | Hacer una pregunta a la librería

Comprar nuevo
EUR 162,00
Convertir moneda

Añadir al carrito

Gastos de envío: EUR 17,13
De Alemania a Estados Unidos de America
Destinos, gastos y plazos de envío

9.

Mario Birkholz
Editorial: Wiley VCH Verlag Gmbh Okt 2005 (2005)
ISBN 10: 3527310525 ISBN 13: 9783527310524
Nuevos Cantidad: 1
Librería
BuchWeltWeit Inh. Ludwig Meier e.K.
(Bergisch Gladbach, Alemania)
Valoración
[?]

Descripción Wiley VCH Verlag Gmbh Okt 2005, 2005. Buch. Estado de conservación: Neu. Neuware - Whereas the X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications. Grain size, porosity, density, preferred orientation and other properties are important to know: whether thin films fulfill their intended function depends crucially on their structure and morphology once a chemical composition has been chosen. Although their backgrounds differ greatly, all the involved specialists a profound understanding of how structural properties may be determined in order to perform their respective tasks in search of new and modern materials, coatings and functions. The author undertakes this in-depth introduction to the field of thin film X-ray characterization in a clear and precise manner. 400 pp. Englisch. Nº de ref. de la librería 9783527310524

Más información sobre esta librería | Hacer una pregunta a la librería

Comprar nuevo
EUR 162,00
Convertir moneda

Añadir al carrito

Gastos de envío: EUR 17,13
De Alemania a Estados Unidos de America
Destinos, gastos y plazos de envío

10.

Birkholz, Mario/ Fewster, Paul F. (Contributor)/ Genzel, Christoph (Contributor)
Editorial: Vch Verlagsgesellschaft Mbh (2006)
ISBN 10: 3527310525 ISBN 13: 9783527310524
Nuevos Tapa dura Cantidad: 2
Librería
Revaluation Books
(Exeter, Reino Unido)
Valoración
[?]

Descripción Vch Verlagsgesellschaft Mbh, 2006. Hardcover. Estado de conservación: Brand New. illustrated edition. 378 pages. 9.50x6.75x0.75 inches. In Stock. Nº de ref. de la librería __3527310525

Más información sobre esta librería | Hacer una pregunta a la librería

Comprar nuevo
EUR 181,45
Convertir moneda

Añadir al carrito

Gastos de envío: EUR 6,72
De Reino Unido a Estados Unidos de America
Destinos, gastos y plazos de envío

Existen otras copia(s) de este libro

Ver todos los resultados de su búsqueda