Artículos relacionados a An Introduction to Logic Circuit Testing (Synthesis...

An Introduction to Logic Circuit Testing (Synthesis Lectures on Digital Circuits & Systems) - Tapa blanda

 
9783031797842: An Introduction to Logic Circuit Testing (Synthesis Lectures on Digital Circuits & Systems)

Sinopsis

An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References

"Sinopsis" puede pertenecer a otra edición de este libro.

Acerca del autor

Parag K. Lala is the Cary and Lois Patterson Chair and Founding Chairman of Electrical Engineering at Texas A&M University, Texarkana; he was also the interim Chair of the Computer and Information Science Department at A&M, Texarkana for a year. Before his current position, he was the Thomas Mullins Chair Professor of Computer Engineering at the University of Arkansas at Fayetteville. He received his M.Sc.(Eng.) degree from the Kings College, University of London, and his Ph.D. from The City University of London. His current research interests are in online testable logic, biologically inspired digital system design, fault-tolerant computing, and hardware-based molecular sequence matching. He has supervised more than 30 M.Sc. and Ph.D. theses and authored or coauthored over 135 papers. He is the author of six books: Fault-Tolerant and Fault-Testable Hardware Design (Prentice-Hall, 1985), Digital System Design Using PLDs (Prentice-Hall, 1990), Practical Digital Logic Design and Testing (Prentice-Hall, 1996), Digital Circuit Testing and Testability (Academic Press, 1997), and Self-Checking, Fault-Tolerant Digital Design (Morgan-Kaufmann, 2001), and Principles of Modern Digital Design (John Wiley and Sons, 2007). He was selected Outstanding Educator in 1994 by the Central North Carolina section of the IEEE. In 1998 he was awarded a D.Sc.(Eng.) degree in electrical engineering by the University of London for contributions to digital hardware design and testing. He was made a Fellow of the IEEE in 2001 for contribution to the development of self-checking logic and associated checker design. He is also a fellow of the IET (Institute of Science and Technology) in the United Kingdom.

"Sobre este título" puede pertenecer a otra edición de este libro.

  • EditorialSpringer
  • Año de publicación2008
  • ISBN 10 3031797841
  • ISBN 13 9783031797842
  • EncuadernaciónTapa blanda
  • IdiomaInglés
  • Número de páginas112
  • Contacto del fabricanteno disponible

Comprar nuevo

Ver este artículo

EUR 11,00 gastos de envío desde Alemania a España

Destinos, gastos y plazos de envío

Otras ediciones populares con el mismo título

9781598293500: An Introduction to Logic Circuit Testing (Synthesis Lectures on Digital Circuits and Systems)

Edición Destacada

ISBN 10:  1598293508 ISBN 13:  9781598293500
Editorial: Morgan and Claypool Publishers, 2008
Tapa blanda

Resultados de la búsqueda para An Introduction to Logic Circuit Testing (Synthesis...

Imagen del vendedor

Parag K. Lala
ISBN 10: 3031797841 ISBN 13: 9783031797842
Nuevo Taschenbuch
Impresión bajo demanda

Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania

Calificación del vendedor: 5 de 5 estrellas Valoración 5 estrellas, Más información sobre las valoraciones de los vendedores

Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips.Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References 112 pp. Englisch. Nº de ref. del artículo: 9783031797842

Contactar al vendedor

Comprar nuevo

EUR 29,95
Convertir moneda
Gastos de envío: EUR 11,00
De Alemania a España
Destinos, gastos y plazos de envío

Cantidad disponible: 2 disponibles

Añadir al carrito

Imagen del vendedor

Parag K. Lala
Publicado por Springer International Publishing, 2008
ISBN 10: 3031797841 ISBN 13: 9783031797842
Nuevo Taschenbuch

Librería: AHA-BUCH GmbH, Einbeck, Alemania

Calificación del vendedor: 5 de 5 estrellas Valoración 5 estrellas, Más información sobre las valoraciones de los vendedores

Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips.Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References. Nº de ref. del artículo: 9783031797842

Contactar al vendedor

Comprar nuevo

EUR 29,95
Convertir moneda
Gastos de envío: EUR 11,99
De Alemania a España
Destinos, gastos y plazos de envío

Cantidad disponible: 1 disponibles

Añadir al carrito

Imagen del vendedor

Lala, Parag K.
ISBN 10: 3031797841 ISBN 13: 9783031797842
Nuevo Tapa blanda
Impresión bajo demanda

Librería: moluna, Greven, Alemania

Calificación del vendedor: 5 de 5 estrellas Valoración 5 estrellas, Más información sobre las valoraciones de los vendedores

Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in d. Nº de ref. del artículo: 608130009

Contactar al vendedor

Comprar nuevo

EUR 28,42
Convertir moneda
Gastos de envío: EUR 19,49
De Alemania a España
Destinos, gastos y plazos de envío

Cantidad disponible: Más de 20 disponibles

Añadir al carrito

Imagen de archivo

Lala, Parag K.
Publicado por Springer, 2008
ISBN 10: 3031797841 ISBN 13: 9783031797842
Nuevo Tapa blanda
Impresión bajo demanda

Librería: Majestic Books, Hounslow, Reino Unido

Calificación del vendedor: 5 de 5 estrellas Valoración 5 estrellas, Más información sobre las valoraciones de los vendedores

Condición: New. Print on Demand. Nº de ref. del artículo: 401726605

Contactar al vendedor

Comprar nuevo

EUR 41,59
Convertir moneda
Gastos de envío: EUR 10,39
De Reino Unido a España
Destinos, gastos y plazos de envío

Cantidad disponible: 4 disponibles

Añadir al carrito

Imagen de archivo

Lala, Parag K.
Publicado por Springer, 2008
ISBN 10: 3031797841 ISBN 13: 9783031797842
Nuevo Tapa blanda

Librería: Books Puddle, New York, NY, Estados Unidos de America

Calificación del vendedor: 4 de 5 estrellas Valoración 4 estrellas, Más información sobre las valoraciones de los vendedores

Condición: New. 1st edition NO-PA16APR2015-KAP. Nº de ref. del artículo: 26394683218

Contactar al vendedor

Comprar nuevo

EUR 42,69
Convertir moneda
Gastos de envío: EUR 9,95
De Estados Unidos de America a España
Destinos, gastos y plazos de envío

Cantidad disponible: 4 disponibles

Añadir al carrito

Imagen de archivo

Lala, Parag K.
Publicado por Springer, 2008
ISBN 10: 3031797841 ISBN 13: 9783031797842
Nuevo Tapa blanda
Impresión bajo demanda

Librería: Biblios, Frankfurt am main, HESSE, Alemania

Calificación del vendedor: 5 de 5 estrellas Valoración 5 estrellas, Más información sobre las valoraciones de los vendedores

Condición: New. PRINT ON DEMAND. Nº de ref. del artículo: 18394683224

Contactar al vendedor

Comprar nuevo

EUR 44,43
Convertir moneda
Gastos de envío: EUR 14,50
De Alemania a España
Destinos, gastos y plazos de envío

Cantidad disponible: 4 disponibles

Añadir al carrito

Imagen del vendedor

Parag K. Lala
ISBN 10: 3031797841 ISBN 13: 9783031797842
Nuevo Taschenbuch

Librería: buchversandmimpf2000, Emtmannsberg, BAYE, Alemania

Calificación del vendedor: 5 de 5 estrellas Valoración 5 estrellas, Más información sobre las valoraciones de los vendedores

Taschenbuch. Condición: Neu. Neuware -An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips.Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / ReferencesSpringer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 112 pp. Englisch. Nº de ref. del artículo: 9783031797842

Contactar al vendedor

Comprar nuevo

EUR 29,95
Convertir moneda
Gastos de envío: EUR 35,00
De Alemania a España
Destinos, gastos y plazos de envío

Cantidad disponible: 2 disponibles

Añadir al carrito