This fully illustrated text explains the basic measurement techniques, describes the commercially available instruments and provides an overview of the current perception of 3-D topography analysis in the academic world and industry, and the commonly used 3-D parameters and plots for the characterizing and visualizing 3-D surface topography. It also includes new sections providing full treatment of surface characterization, filtering technology and engineered surfaces, as well as a fully updated bibliography.
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Professor Liam Blunt is Taylor Hobson Professor of Surface Metrology at the University of Huddersfield, UK. He is author of numerous published papers and other contributions on surface technology, and is co-author with Ken Stout of Three Dimensional Surface Topography (published by Penton Press, 2000).
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Librería: Brook Bookstore On Demand, Napoli, NA, Italia
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Librería: Chiron Media, Wallingford, Reino Unido
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Librería: Majestic Books, Hounslow, Reino Unido
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Librería: Revaluation Books, Exeter, Reino Unido
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Librería: Books Puddle, New York, NY, Estados Unidos de America
Condición: New. pp. 320. Nº de ref. del artículo: 262070349
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Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This fully illustrated text explains the basic measurement techniques, describes the commercially available instruments and provides an overview of the current perception of 3-D topography analysis in the academic world and industry, and the commonly used 3-D parameters and plots for the characterizing and visualizing 3-D surface topography. It also includes new sections providing full treatment of surface characterization, filtering technology and engineered surfaces, as well as a fully updated bibliography. 320 pp. Englisch. Nº de ref. del artículo: 9781857180268
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Librería: Biblios, Frankfurt am main, HESSE, Alemania
Condición: New. pp. 320. Nº de ref. del artículo: 182070343
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Librería: AHA-BUCH GmbH, Einbeck, Alemania
Buch. Condición: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - This fully illustrated text explains the basic measurement techniques, describes the commercially available instruments and provides an overview of the current perception of 3-D topography analysis in the academic world and industry, and the commonly used 3-D parameters and plots for the characterizing and visualizing 3-D surface topography. It also includes new sections providing full treatment of surface characterization, filtering technology and engineered surfaces, as well as a fully updated bibliography. Nº de ref. del artículo: 9781857180268
Cantidad disponible: 2 disponibles