Reliability, Robustness and Failure Mechanisms of LED Devices: Methodology and Evaluation - Tapa dura

Deshayes, Yannick; B�chou, Laurent

9781785481529: Reliability, Robustness and Failure Mechanisms of LED Devices: Methodology and Evaluation

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ISBN 10: 1785481525 ISBN 13: 9781785481529

Editorial: ISTE Press - Elsevier, 2016

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The rapid growth of the use of optoelectronic technology in Information and Communications Technology (ICT) has seen a complementary increase in the performance of such technologies. As a result, optoelectronic technologies have replaced the technology of electronic interconnections. However, the control of manufacturing techniques for optoelectronic systems is more delicate than that of microelectronic technologies.This practical resource, divided into four chapters, examines several methods for determining the reliability of infrared LED devices. The primary interest of this book focuses on methods of extracting fundamental parameters from the electrical and optical characterization of specific zones in components. Failure mechanisms are identified based on measured performance before and after aging tests. Knowledge of failure mechanisms allows formulation of degradation laws, which in turn allow an accurate lifetime distribution for specific devices to be proposed.

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Yannick Deshayes is Associate Professor at the University of Bordeaux, France. His research focuses on the physics of failure, from photonics materials to complex devices. He develops quantum theory to establish degradation laws on photonics devices for LED, laser and photonics applications..

Laurent B�chou is Full Professor in Electronics and Physics at the University of Bordeaux, France, and Visiting Senior Researcher at the Laboratoire Nanotechnologies et Nanosyst�mes (CNRS) at the University of Sherbrooke, Canada. His research mainly addresses advanced electro-optical characterization techniques, physical and failure mechanisms modeling, as well as statistical methods for lifetime prediction of optical devices and emerging photonic systems.

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Editorial: ISTE Press - Elsevier
A�o de publicaci�n: 2016
Idioma: Ingl�s
ISBN 10: 1785481525
ISBN 13: 9781785481529
Encuadernaci�n: Tapa dura
N�mero de edici�n: 1
N�mero de p�ginas: 172
Contacto del fabricante: no disponible
Persona responsable: Barbara Criscuolo
b.criscuolo@lswr.it

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Reliability, Robustness and Failure Mechanisms of LED Devices

Yannick Deshayes

Publicado por Elsevier Science & Technology, ISTE Press - Elsevier, 2016

ISBN 10: 1785481525 ISBN 13: 9781785481529

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Buch. Condici�n: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The rapid growth of the use of optoelectronic technology in Information and Communications Technology (ICT) has seen a complementary increase in the performance of such technologies. As a result, optoelectronic technologies have replaced the technology of electronic interconnections. However, the control of manufacturing techniques for optoelectronic systems is more delicate than that of microelectronic technologies.This practical resource, divided into four chapters, examines several methods for determining the reliability of infrared LED devices. The primary interest of this book focuses on methods of extracting fundamental parameters from the electrical and optical characterization of specific zones in components. Failure mechanisms are identified based on measured performance before and after aging tests. Knowledge of failure mechanisms allows formulation of degradation laws, which in turn allow an accurate lifetime distribution for specific devices to be proposed. Englisch. N� de ref. del art�culo: 9781785481529

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Reliability, Robustness and Failure Mechanisms of LED Devices: Methodology and Evaluation

Yannick Deshayes, Laurent Bechou

Publicado por ISTEPELS 2016-09-26, 2016

ISBN 10: 1785481525 ISBN 13: 9781785481529

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Reliability, Robustness and Failure Mechanisms of Led Devices: Methodology and Evaluation

Deshayes, Yannick/ B�chou, Laurent

Publicado por Elsevier Science Ltd, 2016

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Reliability, Robustness and Failure Mechanisms of LED Devices: Methodology and Evaluation

Deshayes, Yannick; Bechou, Laurent

Publicado por ISTE Press - Elsevier, 2016

ISBN 10: 1785481525 ISBN 13: 9781785481529

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Reliability, Robustness and Failure Mechanisms of LED Devices : Methodology and Evaluation

Yannick Deshayes

Publicado por Elsevier Science & Technology, ISTE Press - Elsevier, 2016

ISBN 10: 1785481525 ISBN 13: 9781785481529

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Buch. Condici�n: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - The rapid growth of the use of optoelectronic technology in Information and Communications Technology (ICT) has seen a complementary increase in the performance of such technologies. As a result, optoelectronic technologies have replaced the technology of electronic interconnections. However, the control of manufacturing techniques for optoelectronic systems is more delicate than that of microelectronic technologies.This practical resource, divided into four chapters, examines several methods for determining the reliability of infrared LED devices. The primary interest of this book focuses on methods of extracting fundamental parameters from the electrical and optical characterization of specific zones in components. Failure mechanisms are identified based on measured performance before and after aging tests. Knowledge of failure mechanisms allows formulation of degradation laws, which in turn allow an accurate lifetime distribution for specific devices to be proposed. N� de ref. del art�culo: 9781785481529

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