Optical Methods of Measurement: Wholefield Techniques, Second Edition (Optical Science and Engineering) - Tapa blanda

Sirohi, Rajpal

 
9781138115491: Optical Methods of Measurement: Wholefield Techniques, Second Edition (Optical Science and Engineering)
Tapa blanda
ISBN 10: 1138115495 ISBN 13: 9781138115491
Editorial: Routledge, 2017

Sinopsis

Optical Methods of Measurement: Wholefield Techniques, Second Edition provides a comprehensive collection of wholefield optical measurement techniques for engineering applications. Along with the reorganization of contents, this edition includes a new chapter on optical interference, new material on nondiffracting and singular beams and their applications, and updated bibliography and additional reading sections.

The book explores the propagation of laser beams, metrological applications of phase-singular beams, various detectors such as CCD and CMOS devices, and recording materials. It also covers interference, diffraction, and digital fringe pattern measurement techniques, with special emphasis on phase measurement interferometry and algorithms. The remainder of the book focuses on theory, experimental arrangements, and applications of wholefield techniques. The author discusses digital hologram interferometry, digital speckle photography, digital speckle pattern interferometry, Talbot interferometry, and holophotoelasticity.

This updated book compiles the major wholefield methods of measurement in one volume. It provides a solid understanding of the techniques by describing the physics behind them. In addition, the examples given illustrate how the techniques solve measurement problems.

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Acerca del autor

Rajpal S. Sirohi is currently the vice chancellor of Amity University. Prior to this, he was the vice chancellor of Barkatullah University and director of the Indian Institute of Technology Delhi. The recipient of many international awards and author of more than 400 papers, Dr. Sirohi is involved with research concerning optical metrology, optical instrumentation, holography, and speckle phenomenon.

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Editorial
Routledge
Año de publicación
2017
Idioma
Inglés
ISBN 10 
1138115495
ISBN 13 
9781138115491
Encuadernación
Tapa blanda
Número de edición
2
Número de páginas
316
Contacto del fabricante
no disponible
Persona responsable
no disponible

Otras ediciones populares con el mismo título

9781574446975: Optical Methods of Measurement: Wholefield Techniques, Second Edition: 146 (Optical Science and Engineering)

Edición Destacada

ISBN 10:  1574446975 ISBN 13:  9781574446975
Editorial: CRC Press, 2009
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