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Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits: 312 (The Springer International Series in Engineering and Computer Science) - Tapa dura
Sinopsis
Analog Signal Generation for Built-In-Self-Test (BIST) of Mixed-Signal Integrated Circuits is a concise introduction to a powerful new signal generation technique.
The book begins with a brief introduction to the testing problem and a review of conventional signal generation techniques. The book then describes an oversampling-based oscillator capable of generating high-precision analog tones using a combination of digital logic and D/A conversion. These concepts are then extended to multi-tone testing schemes without introducing a severe hardware penalty. The concepts are extended further to encompass piece-wise linear waveforms such as square, triangular and sawtooth waves. Experimental results are presented to verify the ideas in each chapter and finally, conclusions are drawn. For those readers unfamiliar with delta-sigma modulation techniques, a brief introduction to this subject is also provided in an appendix.
The book is ideal for test engineers, researchers and circuits designers with an interest in IC testing methods.
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Reseña del editor
Analog Signal Generation for Built-In-Self-Test (BIST) of Mixed-Signal Integrated Circuits is a concise introduction to a powerful new signal generation technique.
The book begins with a brief introduction to the testing problem and a review of conventional signal generation techniques. The book then describes an oversampling-based oscillator capable of generating high-precision analog tones using a combination of digital logic and D/A conversion. These concepts are then extended to multi-tone testing schemes without introducing a severe hardware penalty. The concepts are extended further to encompass piece-wise linear waveforms such as square, triangular and sawtooth waves. Experimental results are presented to verify the ideas in each chapter and finally, conclusions are drawn. For those readers unfamiliar with delta-sigma modulation techniques, a brief introduction to this subject is also provided in an appendix.
The book is ideal for test engineers, researchers and circuits designers with an interest in IC testing methods.
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Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits
Librería: ThriftBooks-Dallas, Dallas, TX, Estados Unidos de America
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Hardcover. Condición: Very Good. No Jacket. May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less 0.85. Nº de ref. del artículo: G0792395646I4N00
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Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits
Librería: ThriftBooks-Dallas, Dallas, TX, Estados Unidos de America
Calificación del vendedor: 5 de 5 estrellas
Hardcover. Condición: Good. No Jacket. Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less 0.85. Nº de ref. del artículo: G0792395646I3N00
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Analog Signal Generation for Built-in-Self-Test of Mixed-Signal Integrated Circuits
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Kluwer Academic Publishers, Boston, 1995
ISBN 10: 0792395646
ISBN 13: 9780792395645
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Librería: PsychoBabel & Skoob Books, Didcot, Reino Unido
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hardcover. Condición: Very Good. Estado de la sobrecubierta: No Dust Jacket. Name from previous owner on FEP. No dust jacket. Binding is very well preserved, pages are clean and crisp, and printing is tight, clean and bright throughout. MB. Used. Nº de ref. del artículo: 248551
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Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits
Publicado por
Springer US, 1995
ISBN 10: 0792395646
ISBN 13: 9780792395645
Antiguo o usado
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Librería: Buchpark, Trebbin, Alemania
Calificación del vendedor: 5 de 5 estrellas
Condición: Gut. Zustand: Gut | Seiten: 136 | Sprache: Englisch | Produktart: Bücher. Nº de ref. del artículo: 3031437/3
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Analog Signal Generation for B
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Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits (The Springer International Series in Engineering and Computer Science)
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Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits (The Springer International Series in Engineering and Computer Science, 312)
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hardcover. Condición: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority! Nº de ref. del artículo: S_433033971
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Analog Signal Generation For Built-in-self-test Of Mixed-signal Integrated Circuits
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Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits
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Gebunden. Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Analog Signal Generation for Built-In-Self-Test (BIST) of Mixed-Signal Integrated Circuits is a concise introduction to a powerful new signal generation technique. The book begins with a brief introduction to the testing problem a. Nº de ref. del artículo: 5971587
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Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits
Impresión bajo demandaLibrería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
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Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Analog Signal Generation for Built-In-Self-Test (BIST) of Mixed-Signal Integrated Circuits is a concise introduction to a powerful new signal generation technique. The book begins with a brief introduction to the testing problem and a review of conventional signal generation techniques. The book then describes an oversampling-based oscillator capable of generating high-precision analog tones using a combination of digital logic and D/A conversion. These concepts are then extended to multi-tone testing schemes without introducing a severe hardware penalty. The concepts are extended further to encompass piece-wise linear waveforms such as square, triangular and sawtooth waves. Experimental results are presented to verify the ideas in each chapter and finally, conclusions are drawn. For those readers unfamiliar with delta-sigma modulation techniques, a brief introduction to this subject is also provided in an appendix. The book is ideal for test engineers, researchers and circuits designers with an interest in IC testing methods. 136 pp. Englisch. Nº de ref. del artículo: 9780792395645
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