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Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits: 312 (The Springer International Series in Engineering and Computer Science, 312) - Tapa dura

Libro 88 de 260: The Springer International Series in Engineering and Computer Science

Lu, Albert K.; Roberts, Gordon W.

 
9780792395645: Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits: 312 (The Springer International Series in Engineering and Computer Science, 312)
Tapa dura
ISBN 10: 0792395646 ISBN 13: 9780792395645
Editorial: Springer, 1995

Sinopsis

Analog Signal Generation for Built-In-Self-Test (BIST) of Mixed-Signal Integrated Circuits is a concise introduction to a powerful new signal generation technique.
The book begins with a brief introduction to the testing problem and a review of conventional signal generation techniques. The book then describes an oversampling-based oscillator capable of generating high-precision analog tones using a combination of digital logic and D/A conversion. These concepts are then extended to multi-tone testing schemes without introducing a severe hardware penalty. The concepts are extended further to encompass piece-wise linear waveforms such as square, triangular and sawtooth waves. Experimental results are presented to verify the ideas in each chapter and finally, conclusions are drawn. For those readers unfamiliar with delta-sigma modulation techniques, a brief introduction to this subject is also provided in an appendix.
The book is ideal for test engineers, researchers and circuits designers with an interest in IC testing methods.

"Sinopsis" puede pertenecer a otra edición de este libro.

Reseña del editor

Analog Signal Generation for Built-In-Self-Test (BIST) of Mixed-Signal Integrated Circuits is a concise introduction to a powerful new signal generation technique.
The book begins with a brief introduction to the testing problem and a review of conventional signal generation techniques. The book then describes an oversampling-based oscillator capable of generating high-precision analog tones using a combination of digital logic and D/A conversion. These concepts are then extended to multi-tone testing schemes without introducing a severe hardware penalty. The concepts are extended further to encompass piece-wise linear waveforms such as square, triangular and sawtooth waves. Experimental results are presented to verify the ideas in each chapter and finally, conclusions are drawn. For those readers unfamiliar with delta-sigma modulation techniques, a brief introduction to this subject is also provided in an appendix.
The book is ideal for test engineers, researchers and circuits designers with an interest in IC testing methods.

"Sobre este título" puede pertenecer a otra edición de este libro.

Editorial
Springer
Año de publicación
1995
Idioma
Inglés
ISBN 10 
0792395646
ISBN 13 
9780792395645
Encuadernación
Tapa dura
Número de páginas
136
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