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Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits: 312 (The Springer International Series in Engineering and Computer Science, 312) - Tapa dura
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Sinopsis
Analog Signal Generation for Built-In-Self-Test (BIST) of Mixed-Signal Integrated Circuits is a concise introduction to a powerful new signal generation technique.
The book begins with a brief introduction to the testing problem and a review of conventional signal generation techniques. The book then describes an oversampling-based oscillator capable of generating high-precision analog tones using a combination of digital logic and D/A conversion. These concepts are then extended to multi-tone testing schemes without introducing a severe hardware penalty. The concepts are extended further to encompass piece-wise linear waveforms such as square, triangular and sawtooth waves. Experimental results are presented to verify the ideas in each chapter and finally, conclusions are drawn. For those readers unfamiliar with delta-sigma modulation techniques, a brief introduction to this subject is also provided in an appendix.
The book is ideal for test engineers, researchers and circuits designers with an interest in IC testing methods.
"Sinopsis" puede pertenecer a otra edición de este libro.
Reseña del editor
Analog Signal Generation for Built-In-Self-Test (BIST) of Mixed-Signal Integrated Circuits is a concise introduction to a powerful new signal generation technique.
The book begins with a brief introduction to the testing problem and a review of conventional signal generation techniques. The book then describes an oversampling-based oscillator capable of generating high-precision analog tones using a combination of digital logic and D/A conversion. These concepts are then extended to multi-tone testing schemes without introducing a severe hardware penalty. The concepts are extended further to encompass piece-wise linear waveforms such as square, triangular and sawtooth waves. Experimental results are presented to verify the ideas in each chapter and finally, conclusions are drawn. For those readers unfamiliar with delta-sigma modulation techniques, a brief introduction to this subject is also provided in an appendix.
The book is ideal for test engineers, researchers and circuits designers with an interest in IC testing methods.
"Sobre este título" puede pertenecer a otra edición de este libro.
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Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits (The Springer International Series in Engineering and Computer Science, 312)
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Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits (The Springer International Series in Engineering and Computer Science)
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Analog Signal Generation for Built-in-Self-Test of Mixed-Signal Integrated Circuits
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Kluwer Academic Publishers, Boston, 1995
ISBN 10: 0792395646
ISBN 13: 9780792395645
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Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits (The Springer International Series in Engineering and Computer Science, 312)
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Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits (The Springer International Series in Engineering and Computer Science, 312)
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Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits
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Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits (The Springer International Series in Engineering and Computer Science, 312)
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Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits
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Springer US, 1995
ISBN 10: 0792395646
ISBN 13: 9780792395645
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Librería: Buchpark, Trebbin, Alemania
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Condición: Gut. Zustand: Gut | Sprache: Englisch | Produktart: Bücher | Analog Signal Generation for Built-In-Self-Test (BIST) of Mixed-Signal Integrated Circuits is a concise introduction to a powerful new signal generation technique. The book begins with a brief introduction to the testing problem and a review of conventional signal generation techniques. The book then describes an oversampling-based oscillator capable of generating high-precision analog tones using a combination of digital logic and D/A conversion. These concepts are then extended to multi-tone testing schemes without introducing a severe hardware penalty. The concepts are extended further to encompass piece-wise linear waveforms such as square, triangular and sawtooth waves. Experimental results are presented to verify the ideas in each chapter and finally, conclusions are drawn. For those readers unfamiliar with delta-sigma modulation techniques, a brief introduction to this subject is also provided in an appendix. The book is ideal for test engineers, researchers and circuits designers with an interest in IC testing methods. Nº de ref. del artículo: 3031437/3
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Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits
Impresión bajo demandaLibrería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
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Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Analog Signal Generation for Built-In-Self-Test (BIST) of Mixed-Signal Integrated Circuits is a concise introduction to a powerful new signal generation technique. The book begins with a brief introduction to the testing problem and a review of conventional signal generation techniques. The book then describes an oversampling-based oscillator capable of generating high-precision analog tones using a combination of digital logic and D/A conversion. These concepts are then extended to multi-tone testing schemes without introducing a severe hardware penalty. The concepts are extended further to encompass piece-wise linear waveforms such as square, triangular and sawtooth waves. Experimental results are presented to verify the ideas in each chapter and finally, conclusions are drawn. For those readers unfamiliar with delta-sigma modulation techniques, a brief introduction to this subject is also provided in an appendix. The book is ideal for test engineers, researchers and circuits designers with an interest in IC testing methods. 136 pp. Englisch. Nº de ref. del artículo: 9780792395645
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Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits (The Springer International Series in Engineering and Computer Science, 312)
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