Frontiers of Characterization and Metrology for Nanoelectronics: 2007 International Conference on Frontiers of Characterization and Metrology: v. 931 ... / Materials Physics and Applications) - Tapa dura
Sinopsis
This book contains peer-reviewed papers presented at the 2007 International Conference on Frontiers of Characterization and Metrology. It emphasizes the frontiers of innovation in the characterization and metrology needed to advance nanoelectronics. It provides an effective portrayal of the industry's characterization and metrology needs and how they are being addressed. It also offers a foundation for further advances in metrology and new ideas for research and development.
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Reseña del editor
This book contains peer-reviewed papers presented at the 2007 International Conference on Frontiers of Characterization and Metrology. It emphasizes the frontiers of innovation in the characterization and metrology needed to advance nanoelectronics. It provides an effective portrayal of the industry’s characterization and metrology needs and how they are being addressed. It also offers a foundation for further advances in metrology and new ideas for research and development.
"Sobre este título" puede pertenecer a otra edición de este libro.
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Frontiers of Characterization and Metrology for Nanoelectronics: 2007 International Conference on Frontiers of Characterization and Metrology for . / Materials Physics and Applications)
Publicado por
American Institute of Physics (edition 2007), 2007
ISBN 10: 0735404410
ISBN 13: 9780735404410
Antiguo o usado
Tapa dura
Librería: BooksRun, Philadelphia, PA, Estados Unidos de America
Calificación del vendedor: 5 de 5 estrellas
Hardcover. Condición: Good. 2007. It's a preowned item in good condition and includes all the pages. It may have some general signs of wear and tear, such as markings, highlighting, slight damage to the cover, minimal wear to the binding, etc., but they will not affect the overall reading experience. Nº de ref. del artículo: 0735404410-11-1-6
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EUR 91,12
Gastos de envío:
GRATIS
A Estados Unidos de America
Cantidad disponible: 1 disponibles
Imagen de archivo
Frontiers of Characterization and Metrology for Nanoelectronics: 2007 International Conference on Frontiers of Characterization and Metrology for Nano
Publicado por
SPRINGER NATURE, 2007
ISBN 10: 0735404410
ISBN 13: 9780735404410
Antiguo o usado
Tapa dura
Librería: Buchpark, Trebbin, Alemania
Calificación del vendedor: 5 de 5 estrellas
Condición: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher. Nº de ref. del artículo: 3966653/12
Comprar usado
EUR 150,85
Gastos de envío:
EUR 105,00
De Alemania a Estados Unidos de America
Cantidad disponible: 1 disponibles