Semiconductor Material and Device Characterization

4,86 valoración promedio
( 7 valoraciones por Goodreads )
 
9780471739067: Semiconductor Material and Device Characterization

THIS THIRD EDITION UPDATES A LANDMARK TEXT WITH THE LATEST FINDINGS THE THIRD EDITION OF THE INTERNATIONALLY LAUDED SEMICONDUCTOR MATERIAL AND DEVICE CHARACTERIZATION BRINGS THE TEXT FULLY UP-TO-DATE WITH THE LATEST DEVELOPMENTS IN THE FIELD AND INCLUDES NEW PEDAGOGICAL TOOLS TO ASSIST READERS. NOT ONLY DOES THE THIRD EDITION SET FORTH ALL THE LATEST MEASUREMENT TECHNIQUES, BUT IT ALSO EXAMINES NEW INTERPRETATIONS AND NEW APPLICATIONS OF EXISTING TECHNIQUES. SEMICONDUCTOR MATERIAL AND DEVICE CHARACTERIZATION REMAINS THE SOLE TEXT DEDICATED TO CHARACTERIZATION TECHNIQUES FOR MEASURING SEMICONDUCTOR MATERIALS AND DEVICES. COVERAGE INCLUDES THE FULL RANGE OF ELECTRICAL AND OPTICAL CHARACTERIZATION METHODS, INCLUDING THE MORE SPECIALIZED CHEMICAL AND PHYSICAL TECHNIQUES. READERS FAMILIAR WITH THE PREVIOUS TWO EDITIONS WILL DISCOVER A THOROUGHLY REVISED AND UPDATED THIRD EDITION, INCLUDING: UPDATED AND REVISED FIGURES AND EXAMPLES REFLECTING THE MOST CURRENT DATA AND INFORMATION 260 NEW REFERENCES OFFERING ACCESS TO THE LATEST RESEARCH AND DISCUSSIONS IN SPECIALIZED TOPICS NEW PROBLEMS AND REVIEW QUESTIONS AT THE END OF EACH CHAPTER TO TEST READERS' UNDERSTANDING OF THE MATERIAL IN ADDITION, READERS WILL FIND FULLY UPDATED AND REVISED SECTIONS IN EACH CHAPTER. PLUS, TWO NEW CHAPTERS HAVE BEEN ADDED: CHARGE-BASED AND PROBE CHARACTERIZATION INTRODUCES CHARGE-BASED MEASUREMENT AND KELVIN PROBES. THIS CHAPTER ALSO EXAMINES PROBE-BASED MEASUREMENTS, INCLUDING SCANNING CAPACITANCE, SCANNING KELVIN FORCE, SCANNING SPREADING RESISTANCE, AND BALLISTIC ELECTRON EMISSION MICROSCOPY. RELIABILITY AND FAILURE ANALYSIS EXAMINES FAILURE TIMES AND DISTRIBUTION FUNCTIONS, AND DISCUSSES ELECTROMIGRATION, HOT CARRIERS, GATE OXIDE INTEGRITY, NEGATIVE BIAS TEMPERATURE INSTABILITY, STRESS-INDUCED LEAKAGE CURRENT, AND ELECTROSTATIC DISCH

"Sinopsis" puede pertenecer a otra edición de este libro.

Críticas:

"I strongly recommend this book for those who want to learn device characterization." (IEEE Circuits & Devices Magazine, November/December 2006)

Reseña del editor:

This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: * Updated and revised figures and examples reflecting the most current data and information *260 new references offering access to the latest research and discussions in specialized topics * New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: * Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. * Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.

"Sobre este título" puede pertenecer a otra edición de este libro.

Los mejores resultados en AbeBooks

1.

SCHRODER
ISBN 10: 0471739065 ISBN 13: 9780471739067
Nuevos Tapa dura Cantidad: 14
Librería
TreeHouseBookstore
(Mountlake Terrace, WA, Estados Unidos de America)
Valoración
[?]

Descripción Hardcover. Estado de conservación: New. BRAND NEW US edition / FREE UPGRADE to FedEx, UPS or Priority Mail / receive your book within 1-4 business days! / [clean wrapped, well protected] [Authentic edition exactly the same as the Official Listing] [ships within 1 business day] / Free tracking number / Genuine US Bookstore! Get your book in perfect condition! We also ship international via FedEx, UPS, or USPS Express!. Nº de ref. de la librería ATGRRGT110471739065

Más información sobre esta librería | Hacer una pregunta a la librería

Comprar nuevo
EUR 96,69
Convertir moneda

Añadir al carrito

Gastos de envío: GRATIS
A Estados Unidos de America
Destinos, gastos y plazos de envío

2.

Dieter K. Schroder
Editorial: Wiley-IEEE Press (2015)
ISBN 10: 0471739065 ISBN 13: 9780471739067
Nuevos Tapa dura Cantidad: 1
Librería
Irish Booksellers
(Rumford, ME, Estados Unidos de America)
Valoración
[?]

Descripción Wiley-IEEE Press, 2015. Hardcover. Estado de conservación: New. book. Nº de ref. de la librería 0471739065

Más información sobre esta librería | Hacer una pregunta a la librería

Comprar nuevo
EUR 104,81
Convertir moneda

Añadir al carrito

Gastos de envío: GRATIS
A Estados Unidos de America
Destinos, gastos y plazos de envío

3.

Schroder, Dieter K.
Editorial: Wiley-IEEE Press (2015)
ISBN 10: 0471739065 ISBN 13: 9780471739067
Nuevos Tapa dura Cantidad: 2
Librería
Murray Media
(North Miami Beach, FL, Estados Unidos de America)
Valoración
[?]

Descripción Wiley-IEEE Press, 2015. Hardcover. Estado de conservación: New. Nº de ref. de la librería P110471739065

Más información sobre esta librería | Hacer una pregunta a la librería

Comprar nuevo
EUR 112,64
Convertir moneda

Añadir al carrito

Gastos de envío: EUR 2,68
A Estados Unidos de America
Destinos, gastos y plazos de envío

4.

Schroder, Dieter K.
Editorial: Wiley-IEEE Press
ISBN 10: 0471739065 ISBN 13: 9780471739067
Nuevos Tapa dura Cantidad: 2
Librería
SGS Trading Inc
(Franklin Lakes, NJ, Estados Unidos de America)
Valoración
[?]

Descripción Wiley-IEEE Press. Hardcover. Estado de conservación: New. 0471739065 New US Edition Textbook, Ships with Emailed Tracking from USA. Nº de ref. de la librería Z0471739065ZN

Más información sobre esta librería | Hacer una pregunta a la librería

Comprar nuevo
EUR 115,34
Convertir moneda

Añadir al carrito

Gastos de envío: EUR 3,48
A Estados Unidos de America
Destinos, gastos y plazos de envío

5.

Dieter K. Schroder
ISBN 10: 0471739065 ISBN 13: 9780471739067
Nuevos Cantidad: 2
Librería
brandnewtexts4sale
(Houston, TX, Estados Unidos de America)
Valoración
[?]

Descripción Estado de conservación: New. 100% BRAND NEW US Edition / Mint condition / Never been read / HARDCOVER / Student 3rd Edition / ISBN: 0471739065. Shipped out in one business day with free tracking. book. Nº de ref. de la librería 211

Más información sobre esta librería | Hacer una pregunta a la librería

Comprar nuevo
EUR 116,59
Convertir moneda

Añadir al carrito

Gastos de envío: EUR 3,57
A Estados Unidos de America
Destinos, gastos y plazos de envío

6.

Dieter K. Schroder
Editorial: John Wiley and Sons Ltd, United Kingdom (2006)
ISBN 10: 0471739065 ISBN 13: 9780471739067
Nuevos Tapa dura Cantidad: 10
Librería
The Book Depository
(London, Reino Unido)
Valoración
[?]

Descripción John Wiley and Sons Ltd, United Kingdom, 2006. Hardback. Estado de conservación: New. 3rd Revised edition. 240 x 160 mm. Language: English . Brand New Book. This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: * Updated and revised figures and examples reflecting the most current data and information *260 new references offering access to the latest research and discussions in specialized topics * New problems and review questions at the end of each chapter to test readers understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: * Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. * Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor s Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department. Nº de ref. de la librería ALB9780471739067

Más información sobre esta librería | Hacer una pregunta a la librería

Comprar nuevo
EUR 129,55
Convertir moneda

Añadir al carrito

Gastos de envío: GRATIS
De Reino Unido a Estados Unidos de America
Destinos, gastos y plazos de envío

7.

Dieter K. Schroder
Editorial: John Wiley and Sons Ltd, United Kingdom (2006)
ISBN 10: 0471739065 ISBN 13: 9780471739067
Nuevos Tapa dura Cantidad: 10
Librería
The Book Depository US
(London, Reino Unido)
Valoración
[?]

Descripción John Wiley and Sons Ltd, United Kingdom, 2006. Hardback. Estado de conservación: New. 3rd Revised edition. 240 x 160 mm. Language: English . Brand New Book. This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: * Updated and revised figures and examples reflecting the most current data and information *260 new references offering access to the latest research and discussions in specialized topics * New problems and review questions at the end of each chapter to test readers understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: * Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. * Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor s Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department. Nº de ref. de la librería ALB9780471739067

Más información sobre esta librería | Hacer una pregunta a la librería

Comprar nuevo
EUR 131,26
Convertir moneda

Añadir al carrito

Gastos de envío: GRATIS
De Reino Unido a Estados Unidos de America
Destinos, gastos y plazos de envío

8.

Dieter K. Schroder
Editorial: Wiley 2006-02-17, Hoboken, N.J. (2006)
ISBN 10: 0471739065 ISBN 13: 9780471739067
Nuevos Tapa dura Cantidad: 1
Librería
Blackwell's
(Oxford, OX, Reino Unido)
Valoración
[?]

Descripción Wiley 2006-02-17, Hoboken, N.J., 2006. hardback. Estado de conservación: New. Nº de ref. de la librería 9780471739067

Más información sobre esta librería | Hacer una pregunta a la librería

Comprar nuevo
EUR 130,41
Convertir moneda

Añadir al carrito

Gastos de envío: EUR 5,16
De Reino Unido a Estados Unidos de America
Destinos, gastos y plazos de envío

9.

Dieter K. Schroder
Editorial: John Wiley and Sons Ltd
ISBN 10: 0471739065 ISBN 13: 9780471739067
Nuevos Tapa dura Cantidad: 10
Librería
THE SAINT BOOKSTORE
(Southport, Reino Unido)
Valoración
[?]

Descripción John Wiley and Sons Ltd. Hardback. Estado de conservación: new. BRAND NEW, Semiconductor Material and Device Characterization (3rd Revised edition), Dieter K. Schroder, This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: * Updated and revised figures and examples reflecting the most current data and information *260 new references offering access to the latest research and discussions in specialized topics * New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: * Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. * Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department. Nº de ref. de la librería B9780471739067

Más información sobre esta librería | Hacer una pregunta a la librería

Comprar nuevo
EUR 138,89
Convertir moneda

Añadir al carrito

Gastos de envío: EUR 6,81
De Reino Unido a Estados Unidos de America
Destinos, gastos y plazos de envío

10.

Dieter K. Schroder (Arizona State Univ.)
Editorial: John Wiley and Sons
ISBN 10: 0471739065 ISBN 13: 9780471739067
Nuevos Cantidad: > 20
Librería
INDOO
(Avenel, NJ, Estados Unidos de America)
Valoración
[?]

Descripción John Wiley and Sons. Estado de conservación: New. Brand New. Nº de ref. de la librería 0471739065

Más información sobre esta librería | Hacer una pregunta a la librería

Comprar nuevo
EUR 147,74
Convertir moneda

Añadir al carrito

Gastos de envío: EUR 3,13
A Estados Unidos de America
Destinos, gastos y plazos de envío

Existen otras copia(s) de este libro

Ver todos los resultados de su búsqueda