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Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report, January 1 to March 30, 1972 (Classic Reprint) - Tapa dura
Sinopsis
Excerpt from Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report, January 1 to March 30, 1972
The work of the Program is divided into a number of tasks, each directed toward the study of a particular material or device property or measurement technique. This report is subdivided according to these tasks. Highlights of activity during the quarter are given in section 2. Section 3 deals with tasks on methods of measurement for materials; section 4, with those on methods of measurement for process control.
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This book is a reproduction of an important historical work. Forgotten Books uses state-of-the-art technology to digitally reconstruct the work, preserving the original format whilst repairing imperfections present in the aged copy. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in our edition. We do, however, repair the vast majority of imperfections successfully; any imperfections that remain are intentionally left to preserve the state of such historical works.
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Excerpt from Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report, January 1 to March 30, 1972
The work of the Program is divided into a number of tasks, each directed toward the study of a particular material or device property or measurement technique. This report is subdivided according to these tasks. Highlights of activity during the quarter are given in section 2. Section 3 deals with tasks on methods of measurement for materials; section 4, with those on methods of measurement for process control.
About the Publisher
Forgotten Books publishes hundreds of thousands of rare and classic books. Find more at www.forgottenbooks.com
This book is a reproduction of an important historical work. Forgotten Books uses state-of-the-art technology to digitally reconstruct the work, preserving the original format whilst repairing imperfections present in the aged copy. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in our edition. We do, however, repair the vast majority of imperfections successfully; any imperfections that remain are intentionally left to preserve the state of such historical works.
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Methods of Measurement for Semiconductor Materials, Process Control, and Devices Quarterly Report, January 1 to March 30, 1972 Classic Reprint
Librería: PBShop.store US, Wood Dale, IL, Estados Unidos de America
Calificación del vendedor: 5 de 5 estrellas
HRD. Condición: New. New Book. Shipped from UK. Established seller since 2000. Nº de ref. del artículo: LX-9780365302056
Cantidad disponible: 15 disponibles
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Methods of Measurement for Semiconductor Materials, Process Control, and Devices Quarterly Report, January 1 to March 30, 1972 Classic Reprint
Librería: PBShop.store UK, Fairford, GLOS, Reino Unido
Calificación del vendedor: 5 de 5 estrellas
HRD. Condición: New. New Book. Shipped from UK. Established seller since 2000. Nº de ref. del artículo: LX-9780365302056
Cantidad disponible: 15 disponibles