Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report, January 1 to March 30, 1972 (Classic Reprint) - Tapa blanda

Methods of Measurement for Semiconductor Materials, Process Control, and

Paperback. Condición: New. Print on Demand. This book delves into the field of methods of measurement for semiconductor materials, process control, and devices. It encompasses a wide range of topics, including resistivity, gold-doped silicon, infrared methods, die attachment evaluation, thermal properties of devices, microwave device measurements, and carrier transport in junction devices. The author, an expert in the field, provides a comprehensive overview of the current state of the art in these areas. The book is highly technical and assumes a strong background in semiconductor physics and measurement techniques. It is primarily intended for researchers, engineers, and scientists working in the semiconductor industry or in related fields. The insights presented in this book are essential for advancing the development and manufacturing of high-quality semiconductor devices. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item. Nº de ref. del artículo: 9780365302025_0

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