Methods of Measurement for Semiconductor Materials, Process Control, and Divices: Quarterly Report, January 1 to March 31, 1970 (Classic Reprint) - Tapa dura

Sinopsis

Excerpt from Methods of Measurement for Semiconductor Materials, Process Control, and Divices: Quarterly Report, January 1 to March 31, 1970

Besides the tasks sponsored under the Joint Program, this report con tains descriptions of activity on related projects supported by nbs or other agencies. Although the specific objectives of these projects are different from those of the Joint Program, much of the activity undertaken in these projects will be of interest to Joint Program sponsors. The sponsor of each of these related projects is identified in the description of the project.

About the Publisher

Forgotten Books publishes hundreds of thousands of rare and classic books. Find more at www.forgottenbooks.com

This book is a reproduction of an important historical work. Forgotten Books uses state-of-the-art technology to digitally reconstruct the work, preserving the original format whilst repairing imperfections present in the aged copy. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in our edition. We do, however, repair the vast majority of imperfections successfully; any imperfections that remain are intentionally left to preserve the state of such historical works.

"Sinopsis" puede pertenecer a otra edición de este libro.