Atomic Force Microscopy

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9780199570454: Atomic Force Microscopy

Atomic force microscopy is an amazing technique that allies a versatile methodology (that allows measurement of samples in liquid, vacuum or air) to imaging with unprecedented resolution. But it goes one step further than conventional microscopic techniques; it allows us to make measurements of magnetic, electrical or mechanical properties of the widest possible range of samples, with nanometre resolution. This book will demystify AFM for the reader, making it easy to understand, and to use. It is written by authors who together have more than 30 years experience in the design, construction and use of AFMs and will explain why the microscopes are made the way they are, how they should be used, what data they can produce, and what can be done with the data. Illustrative examples from the physical sciences, materials science, life sciences, nanotechnology and industry illustrate the different capabilities of the technique.

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About the Author:


Peter Eaton has more than ten years' experience in research using Atomic Force Microscopy. He has used a wide variety of AFM instruments in research centres and universities in the UK, France, Spain, and Portugal. He has used AFM to study pharmaceutical, chemical, materials science, nanotech and biological samples. He is the author of more than twenty research publications on AFM.

Paul West has over twenty-five years' experience with the development of atomic force microscopes. He is the co-founder of several AFM companies, the author of numerous patents, and co-author of several publications on the design and application of atomic force microscopes. He served on the United States National Nanotechnology Initiative which resulted in the first major funding of nanotechnology research.

Review:

"This book can be called a practical introduction to atomic force microscopy (AFM). It is outstanding among those written on this subject. I have worked with AFM starting from the year of its invention, and have seen books written quite formally. This book is written by true experts with a deep knowledge of the AFM technique" "This is structured as a sort of "super manual." I wish I had such a useful text when learning this technique." - Prof. Igor Sokolov, in MRS Bulletin
"As a frequent AFM user, I've been often asked, 'is there a book you recommend for students who are new to AFM techniques?' For a long time there wasn't, but now there's Atomic Force Microscopy. One of the book's main strengths is that it is relatively short...it might be the upper limit of what students are willing to handle...a great introduction to AFMs for beginners and also serves as a good starting point for more serious users." -- Udo D. Schwarz, Yale University


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Peter Eaton, Paul West
Editorial: Oxford University Press, United Kingdom (2010)
ISBN 10: 0199570450 ISBN 13: 9780199570454
Nuevos Tapa dura Cantidad: 10
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(London, Reino Unido)
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Descripción Oxford University Press, United Kingdom, 2010. Hardback. Estado de conservación: New. Language: English . Brand New Book. Atomic force microscopy is an amazing technique that allies a versatile methodology (that allows measurement of samples in liquid, vacuum or air) to imaging with unprecedented resolution. But it goes one step further than conventional microscopic techniques; it allows us to make measurements of magnetic, electrical or mechanical properties of the widest possible range of samples, with nanometre resolution. This book will demystify AFM for the reader, making it easy to understand, and to use. It is written by authors who together have more than 30 years experience in the design, construction and use of AFMs and will explain why the microscopes are made the way they are, how they should be used, what data they can produce, and what can be done with the data. Illustrative examples from the physical sciences, materials science, life sciences, nanotechnology and industry illustrate the different capabilities of the technique. Nº de ref. de la librería AOP9780199570454

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Peter Eaton, Paul West
Editorial: OUP Oxford 2010-03-25, Oxford (2010)
ISBN 10: 0199570450 ISBN 13: 9780199570454
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Descripción OUP Oxford 2010-03-25, Oxford, 2010. hardback. Estado de conservación: New. Nº de ref. de la librería 9780199570454

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Peter Eaton, Paul West
Editorial: Oxford University Press, United Kingdom (2010)
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Descripción Oxford University Press, United Kingdom, 2010. Hardback. Estado de conservación: New. Language: English . Brand New Book. Atomic force microscopy is an amazing technique that allies a versatile methodology (that allows measurement of samples in liquid, vacuum or air) to imaging with unprecedented resolution. But it goes one step further than conventional microscopic techniques; it allows us to make measurements of magnetic, electrical or mechanical properties of the widest possible range of samples, with nanometre resolution. This book will demystify AFM for the reader, making it easy to understand, and to use. It is written by authors who together have more than 30 years experience in the design, construction and use of AFMs and will explain why the microscopes are made the way they are, how they should be used, what data they can produce, and what can be done with the data. Illustrative examples from the physical sciences, materials science, life sciences, nanotechnology and industry illustrate the different capabilities of the technique. Nº de ref. de la librería AOP9780199570454

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Peter Eaton, Paul West
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Descripción Oxford University Press. Hardback. Estado de conservación: new. BRAND NEW, Atomic Force Microscopy, Peter Eaton, Paul West, Atomic force microscopy is an amazing technique that allies a versatile methodology (that allows measurement of samples in liquid, vacuum or air) to imaging with unprecedented resolution. But it goes one step further than conventional microscopic techniques; it allows us to make measurements of magnetic, electrical or mechanical properties of the widest possible range of samples, with nanometre resolution. This book will demystify AFM for the reader, making it easy to understand, and to use. It is written by authors who together have more than 30 years experience in the design, construction and use of AFMs and will explain why the microscopes are made the way they are, how they should be used, what data they can produce, and what can be done with the data. Illustrative examples from the physical sciences, materials science, life sciences, nanotechnology and industry illustrate the different capabilities of the technique. Nº de ref. de la librería B9780199570454

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Descripción OUP Oxford, 2010. HRD. Estado de conservación: New. New Book. Shipped from UK in 4 to 14 days. Established seller since 2000. Nº de ref. de la librería FU-9780199570454

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Descripción 2010. HRD. Estado de conservación: New. New Book. Shipped from US within 10 to 14 business days. Established seller since 2000. Nº de ref. de la librería VU-9780199570454

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Descripción Oxford Univ Pr, 2010. Hardcover. Estado de conservación: Brand New. 248 pages. 9.75x7.00x0.75 inches. In Stock. Nº de ref. de la librería __0199570450

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Descripción Estado de conservación: New. Depending on your location, this item may ship from the US or UK. Nº de ref. de la librería 97801995704540000000

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Descripción Oxford University Press, USA, 2010. Hardcover. Estado de conservación: New. Nº de ref. de la librería DADAX0199570450

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