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Publicado por Springer, 2014
ISBN 10: 1489995099ISBN 13: 9781489995094
Librería: GF Books, Inc., Hawthorne, CA, Estados Unidos de America
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Condición: New. Book is in NEW condition.
Publicado por Springer, 2014
ISBN 10: 1489995099ISBN 13: 9781489995094
Librería: booksXpress, Bayonne, NJ, Estados Unidos de America
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Soft Cover. Condición: new.
Publicado por Springer, 2014
ISBN 10: 1489995099ISBN 13: 9781489995094
Librería: Ria Christie Collections, Uxbridge, Reino Unido
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Condición: New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book.
Publicado por Springer, 1998
ISBN 10: 0306459361ISBN 13: 9780306459368
Librería: dsmbooks, Liverpool, Reino Unido
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Hardcover. Condición: Like New. Like New. book.
Publicado por Springer, 2014
ISBN 10: 1489995099ISBN 13: 9781489995094
Librería: GF Books, Inc., Hawthorne, CA, Estados Unidos de America
Libro
Condición: Fine. Book is in Used-LikeNew condition. Pages and cover are clean and intact. Used items may not include supplementary materials such as CDs or access codes. May show signs of minor shelf wear.
Publicado por Springer US Okt 2014, 2014
ISBN 10: 1489995099ISBN 13: 9781489995094
Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
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Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Preface to Second Edition Several new topics have been added, some small errors have been corrected and some new references have been added in this edition. New topics include aberration corrected instruments, scanning confocal mode of operations, Bloch wave eigenvalue methods and parallel computing techniques. The rst edition - cluded a CD with computer programs, which is not included in this edition. - stead the associated programs will be available on an associated web site (currently people.ccmr.cornell.edu/ kirkland,but may move as time goes on). I wish to thank Mick Thomas for preparing the specimen used to record the image in Fig.5.26 and to thank Stephen P. Meisburger for suggesting an interesting biological specimen to use in Fig.7.24. Again, I apologize in advance for leaving out some undoubtedlyoutstanding r- erences. I also apologize for the as yet undiscovered errors that remain in the text. Earl J. Kirkland, December 2009 Preface to First Edition Image simulation has become a common tool in HREM (High Resolution El- tron Microscopy) in recent years. However, the literature on the subject is scattered among many different journals and conference proceedings that have occurred in the last two or three decades. It is dif cult for beginners to get started in this eld. 300 pp. Englisch.
Publicado por Springer US, 2014
ISBN 10: 1489995099ISBN 13: 9781489995094
Librería: moluna, Greven, Alemania
Libro Impresión bajo demanda
Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This book features numerical computation of electron microscopy images as well as multislice methodsHigh resolution CTEM and STEM image interpretation are included in the textThis newly updated second edition will bring the reader up to dat.
Publicado por Springer, 2020
ISBN 10: 3030332594ISBN 13: 9783030332594
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de America
Libro
Condición: New.
Publicado por Springer US, 2014
ISBN 10: 1489995099ISBN 13: 9781489995094
Librería: AHA-BUCH GmbH, Einbeck, Alemania
Libro
Taschenbuch. Condición: Neu. Druck auf Anfrage Neuware - Printed after ordering - Preface to Second Edition Several new topics have been added, some small errors have been corrected and some new references have been added in this edition. New topics include aberration corrected instruments, scanning confocal mode of operations, Bloch wave eigenvalue methods and parallel computing techniques. The rst edition - cluded a CD with computer programs, which is not included in this edition. - stead the associated programs will be available on an associated web site (currently people.ccmr.cornell.edu/ kirkland,but may move as time goes on). I wish to thank Mick Thomas for preparing the specimen used to record the image in Fig.5.26 and to thank Stephen P. Meisburger for suggesting an interesting biological specimen to use in Fig.7.24. Again, I apologize in advance for leaving out some undoubtedlyoutstanding r- erences. I also apologize for the as yet undiscovered errors that remain in the text. Earl J. Kirkland, December 2009 Preface to First Edition Image simulation has become a common tool in HREM (High Resolution El- tron Microscopy) in recent years. However, the literature on the subject is scattered among many different journals and conference proceedings that have occurred in the last two or three decades. It is dif cult for beginners to get started in this eld.
Publicado por Springer, 2014
ISBN 10: 1489995099ISBN 13: 9781489995094
Librería: Revaluation Books, Exeter, Reino Unido
Libro
Paperback. Condición: Brand New. 2nd edition. 299 pages. 9.25x6.10x0.68 inches. In Stock.
Publicado por Springer, 2021
ISBN 10: 3030332624ISBN 13: 9783030332624
Librería: GF Books, Inc., Hawthorne, CA, Estados Unidos de America
Libro
Condición: New. Book is in NEW condition.
Publicado por Springer, 2021
ISBN 10: 3030332624ISBN 13: 9783030332624
Librería: GF Books, Inc., Hawthorne, CA, Estados Unidos de America
Libro
Condición: Fine. Book is in Used-LikeNew condition. Pages and cover are clean and intact. Used items may not include supplementary materials such as CDs or access codes. May show signs of minor shelf wear.
Publicado por Springer, 2021
ISBN 10: 3030332624ISBN 13: 9783030332624
Librería: Book Deals, Tucson, AZ, Estados Unidos de America
Libro
Condición: New. New! This book is in the same immaculate condition as when it was published.
Publicado por Springer, 2021
ISBN 10: 3030332624ISBN 13: 9783030332624
Librería: booksXpress, Bayonne, NJ, Estados Unidos de America
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Soft Cover. Condición: new.
Publicado por Springer, 2020
ISBN 10: 3030332594ISBN 13: 9783030332594
Librería: booksXpress, Bayonne, NJ, Estados Unidos de America
Libro
Hardcover. Condición: new.
Publicado por Springer, 2021
ISBN 10: 3030332624ISBN 13: 9783030332624
Librería: Ria Christie Collections, Uxbridge, Reino Unido
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Condición: New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book.
Publicado por Springer, 2020
ISBN 10: 3030332594ISBN 13: 9783030332594
Librería: Ria Christie Collections, Uxbridge, Reino Unido
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Condición: New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book.
Publicado por Springer, 2021
ISBN 10: 3030332624ISBN 13: 9783030332624
Librería: Books Unplugged, Amherst, NY, Estados Unidos de America
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Condición: Good. Buy with confidence! Book is in good condition with minor wear to the pages, binding, and minor marks within.
Publicado por Springer, 2021
ISBN 10: 3030332624ISBN 13: 9783030332624
Librería: Book Deals, Tucson, AZ, Estados Unidos de America
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Condición: Very Good. Very Good condition. Shows only minor signs of wear, and very minimal markings inside (if any).
Publicado por Springer, 2021
ISBN 10: 3030332624ISBN 13: 9783030332624
Librería: Book Deals, Tucson, AZ, Estados Unidos de America
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Condición: Fine. Like New condition. Great condition, but not exactly fully crisp. The book may have been opened and read, but there are no defects to the book, jacket or pages.
Publicado por Springer, 2021
ISBN 10: 3030332624ISBN 13: 9783030332624
Librería: GF Books, Inc., Hawthorne, CA, Estados Unidos de America
Libro
Condición: Very Good. Book is in Used-VeryGood condition. Pages and cover are clean and intact. Used items may not include supplementary materials such as CDs or access codes. May show signs of minor shelf wear and contain very limited notes and highlighting.
Publicado por Springer, 2021
ISBN 10: 3030332624ISBN 13: 9783030332624
Librería: Books Unplugged, Amherst, NY, Estados Unidos de America
Libro
Condición: Fair. Buy with confidence! Book is in acceptable condition with wear to the pages, binding, and some marks within.
Publicado por Springer, 2020
ISBN 10: 3030332594ISBN 13: 9783030332594
Librería: GreatBookPricesUK, Castle Donington, DERBY, Reino Unido
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Condición: New.
Publicado por Springer, 2020
ISBN 10: 3030332594ISBN 13: 9783030332594
Librería: GreatBookPrices, Columbia, MD, Estados Unidos de America
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Condición: As New. Unread book in perfect condition.
Publicado por Springer-Verlag New York Inc., 2014
ISBN 10: 1489995099ISBN 13: 9781489995094
Librería: THE SAINT BOOKSTORE, Southport, Reino Unido
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Paperback / softback. Condición: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days.
Publicado por Springer International Publishing Mrz 2020, 2020
ISBN 10: 3030332594ISBN 13: 9783030332594
Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
Libro Impresión bajo demanda
Buch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy. 368 pp. Englisch.
Publicado por Springer International Publishing Mrz 2021, 2021
ISBN 10: 3030332624ISBN 13: 9783030332624
Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
Libro Impresión bajo demanda
Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy. 368 pp. Englisch.
Publicado por Springer International Publishing, 2020
ISBN 10: 3030332594ISBN 13: 9783030332594
Librería: moluna, Greven, Alemania
Libro Impresión bajo demanda
Gebunden. Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Features in-depth coverage of numerical computation of electron microscopy images including multislice methodsCovers high resolution CTEM and STEM image interpretation Addresses the latest developments in the field from the last decade.
Publicado por Springer International Publishing, 2021
ISBN 10: 3030332624ISBN 13: 9783030332624
Librería: moluna, Greven, Alemania
Libro Impresión bajo demanda
Condición: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Features in-depth coverage of numerical computation of electron microscopy images including multislice methodsCovers high resolution CTEM and STEM image interpretation Addresses the latest developments in the field from the last decade.
Publicado por Springer, 2020
ISBN 10: 3030332594ISBN 13: 9783030332594
Librería: GreatBookPricesUK, Castle Donington, DERBY, Reino Unido
Libro
Condición: As New. Unread book in perfect condition.